Published December 1, 2003 | Version v1
Journal article

Contacts, non-linear transport effects and failure in multi-walled carbon nanotubes

  • 1. School of Physics, Georgia Institute of Technology, Atlanta, GA 30332 (United States)

Description

Pristine arc-produced multi-walled carbon nanotubes are contacted to liquid mercury in situ in a transmission electron microscope. The conductance G(V) for all tubes increases with increasing bias voltage V. This is related to the electronic density of the nanotubes. Similar G(V) behaviour is observed for HOPG-graphite contacted in air with Hg, with dG(V)/dV∼0.3G0. Variations observed in the conductance are related to nanotube-Hg contact effects. For tubes barely touching the Hg surface, the conductance is low (typically G(V=0)∼0.1-0.5G0); G(V) may maximize around V=1.5-2 V or continue to increase linearly depending on the MWNT-Hg contact. For good contacts the maximum low-bias conductance is 1G0. Non-conducting tubes are observed having a low-bias conductance smaller than 10-3G0. High-voltage tube failure usually occurs at the contact with Hg for clean tubes, or at tube defects. An important phenomenon is the formation of a Hg bubble near the contact nanotube-Hg surface when the nanotube is negatively biased, under high bias current conditions, indicating the heating effect of hot electrons injected into the mercury

Availability note (English)

Available online at http://stacks.iop.org/1367-2630/5/158/njp3_1_158.pdf or at the Web site for the journal New Journal of Physics (ISSN 1367-2630) http://www.iop.org/

Additional details

Publishing Information

Journal Title
New Journal of Physics
Journal Volume
5
Journal Issue
1
Journal Page Range
p. 158
ISSN
1367-2630

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
35023237
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
CARBON; ELECTRIC CONDUCTIVITY; ELECTRON DENSITY; MERCURY; NANOTUBES; TRANSMISSION ELECTRON MICROSCOPY
Descriptors DEC
ELECTRICAL PROPERTIES; ELECTRON MICROSCOPY; ELEMENTS; METALS; MICROSCOPY; NANOSTRUCTURES; NONMETALS; PHYSICAL PROPERTIES