ESR studies of MoO3/In2O3 amorphous thin films deposited by Co-evaporation

ESR spectra of amorphous thin films of MoO3/In2O3 are reported for a series of films of varying compositions and interpreted in relation to the ESR spectra of pure MoO3 films. The effects of changes in composition, film thickness, substrate deposition temperature and annealing on the ESR spectra are presented. A decrease in the intensity of ESR signal arising from Mo(V) with increasing content of In2O3 in MoO3 is attributed to the incorporation of In(III) ions in the MoO3 lattice. The ESR signal at g = 1.92 vanishes on annealing in vacuum at 300 0C and this is attributed to the weak absorption of oxygen on Mo(V). (author)