Published 1994 | Version v1
Miscellaneous

252Cf SEU testing system

Creators

  • 1. Beijing Univ., BJ (China). Dept. of Technical Physics

Description

The paper describes a 252Cf SEU (single-event upsets) testing system: its principle, structure, performances and testing results

Part of:
Proceedings of 7. national conference on nuclear electronics and nuclear detection technology: Pt.1

Additional details

Publishing Information

Imprint Title
Proceedings of 7. national conference on nuclear electronics and nuclear detection technology: Pt.1
Imprint Pagination
359 p.
Journal Page Range
p. 60-62.

Conference

Title
7. national conference on nuclear electronics and nuclear detection technology.
Dates
6-12 Oct 1994.
Place
Lushan (China).

Optional Information