Published November 2006
| Version v1
Journal article
Beyond muffin-tin model for theoretical analysis of As K-edge XANES of InAs
Creators
- 1. Faculty of Physics, Rostov State University, Sorge 5, Rostov-on-Don 344090 (Russian Federation)
- 2. Laboratorie de Cristallographie, CNRS, associe a l'Universite Joseph Fourier, BP166, F38042 Grenoble Cedex 9 (France)
- 3. European Synchrotron Radiation Facility, F38043 Grenoble Cedex (France)
Description
Three alternative approaches have been applied to calculate As K-edge XANES of InAs: multiple scattering (MS) theory, non-muffin-tin finite difference method (FDM) and full potential linearized augmented plane wave (FLAPW) method. Such combination allows to make the distinction between two types of non-muffin-tin effects. First, in the interstitial region the potential is not constant. Second, the covalent bonds increase the charge density between nearest atoms and lead to additional loss of spherical symmetry of the potential within MT spheres
Additional details
Identifiers
- DOI
- 10.1016/j.radphyschem.2005.10.024;
- PII
- S0969-806X(06)00219-2;
Publishing Information
- Journal Title
- Radiation Physics and Chemistry (1993)
- Journal Volume
- 75
- Journal Issue
- 11
- Journal Page Range
- p. 1571-1573
- ISSN
- 0969-806X
- CODEN
- RPCHDM
Conference
- Title
- 20. international conference on X-ray and inner-shell processes
- Dates
- 4-8 Jul 2005
- Place
- Melbourne (Australia)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38040061
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ABSORPTION SPECTROSCOPY; ATOMS; CHARGE DENSITY; FINITE DIFFERENCE METHOD; INDIUM ARSENIDES; MUFFIN-TIN POTENTIAL; MULTIPLE SCATTERING; SYMMETRY; X-RAY SPECTROSCOPY
- Descriptors DEC
- ARSENIC COMPOUNDS; ARSENIDES; CALCULATION METHODS; INDIUM COMPOUNDS; ITERATIVE METHODS; MATHEMATICAL SOLUTIONS; NUMERICAL SOLUTION; PNICTIDES; POTENTIALS; SCATTERING; SPECTROSCOPY
Optional Information
- Copyright
- Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.