Published November 2006 | Version v1
Journal article

Beyond muffin-tin model for theoretical analysis of As K-edge XANES of InAs

  • 1. Faculty of Physics, Rostov State University, Sorge 5, Rostov-on-Don 344090 (Russian Federation)
  • 2. Laboratorie de Cristallographie, CNRS, associe a l'Universite Joseph Fourier, BP166, F38042 Grenoble Cedex 9 (France)
  • 3. European Synchrotron Radiation Facility, F38043 Grenoble Cedex (France)

Description

Three alternative approaches have been applied to calculate As K-edge XANES of InAs: multiple scattering (MS) theory, non-muffin-tin finite difference method (FDM) and full potential linearized augmented plane wave (FLAPW) method. Such combination allows to make the distinction between two types of non-muffin-tin effects. First, in the interstitial region the potential is not constant. Second, the covalent bonds increase the charge density between nearest atoms and lead to additional loss of spherical symmetry of the potential within MT spheres

Additional details

Identifiers

DOI
10.1016/j.radphyschem.2005.10.024;
PII
S0969-806X(06)00219-2;

Publishing Information

Journal Title
Radiation Physics and Chemistry (1993)
Journal Volume
75
Journal Issue
11
Journal Page Range
p. 1571-1573
ISSN
0969-806X
CODEN
RPCHDM

Conference

Title
20. international conference on X-ray and inner-shell processes
Dates
4-8 Jul 2005
Place
Melbourne (Australia)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
38040061
Subject category
S74: ATOMIC AND MOLECULAR PHYSICS;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ABSORPTION SPECTROSCOPY; ATOMS; CHARGE DENSITY; FINITE DIFFERENCE METHOD; INDIUM ARSENIDES; MUFFIN-TIN POTENTIAL; MULTIPLE SCATTERING; SYMMETRY; X-RAY SPECTROSCOPY
Descriptors DEC
ARSENIC COMPOUNDS; ARSENIDES; CALCULATION METHODS; INDIUM COMPOUNDS; ITERATIVE METHODS; MATHEMATICAL SOLUTIONS; NUMERICAL SOLUTION; PNICTIDES; POTENTIALS; SCATTERING; SPECTROSCOPY

Optional Information

Copyright
Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.