Published May 7, 2012 | Version v1
Journal article

Low-temperature, site selective graphitization of SiC via ion implantation and pulsed laser annealing

  • 1. Department of Materials Science and Engineering, University of Florida, Gainesville, Florida 32601 (United States)
  • 2. Nanoscience Institute for Medical and Engineering Technology, University of Florida, Gainesville, Florida 32601 (United States)
  • 3. Department of Materials Science and Engineering, University of California, Berkeley, California 94720 (United States)
  • 4. Department of Physics, University of Florida, Gainesville, Florida 32601 (United States)
  • 5. Department of Chemical Engineering, University of Florida, Gainesville, Florida 32601 (United States)
  • 6. Department of Electronic Materials Engineering, Australian National University, Canberra, ACT 0200 (Australia)
  • 7. Raith USA, Incorporated, Ronkonkoma, New York 11779 (United States)

Description

A technique is presented to selectively graphitize regions of SiC by ion implantation and pulsed laser annealing (PLA). Nanoscale features are patterned over large areas by multi-ion beam lithography and subsequently converted to few-layer graphene via PLA in air. Graphitization occurs only where ions have been implanted and without elevating the temperature of the surrounding substrate. Samples were characterized using Raman spectroscopy, ion scattering/channeling, SEM, and AFM, from which the degree of graphitization was determined to vary with implantation species, damage and dose, laser fluence, and pulsing. Contrasting growth regimes and graphitization mechanisms during PLA are discussed.

Additional details

Identifiers

Publishing Information

Journal Title
Applied Physics Letters
Journal Volume
100
Journal Issue
19
Journal Page Range
p. 193105-193105.4
ISSN
0003-6951
CODEN
APPLAB

Optional Information

Notes
(c) 2012 American Institute of Physics