Synthesis and characterization of indium-tin oxide nanostructures
Creators
- 1. Institute of Low Temperature and Structure Research of Polish Academy of Sciences ul. Okolna 2, 50-422 Wroclaw (Poland)
Description
The nanocrystalline indium-tin oxide (ITO) was synthesized by the modified Pechini method. The thermal analysis (TGA and DTA) of sintering process were carried out for 3 samples with a different substrate's ratio. The structure and morphology of obtained powders were determined by the XRD measurement and TEM images. Average grains size of nanocrystals was estimated from bordering of the diffraction peak using a Scherrer's equation. The influences of sintering temperature as well as conditions of synthesis on average grains size were observed. In order to determine the conductive properties of obtained nanopowders the ITO layers were fabricated using the spin-coating method. The layer's resistance was measured by the four points method. Also the optical transmission of obtained layers was measured and compared. An influence of the conditions of synthesis on the properties of obtained materials and their application will be discussed in this work.
Availability note (English)
Available from http://dx.doi.org/10.1088/1742-6596/146/1/012033Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Conference Series (Online)
- Journal Volume
- 146
- Journal Issue
- 1
- Journal Page Range
- [10 p.]
- ISSN
- 1742-6596
Conference
- Title
- 2. national conference on nanotechnology
- Acronym
- NANO 2008
- Dates
- 25-28 Jun 2008
- Place
- Krakow (Poland)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41050429
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- DIFFERENTIAL THERMAL ANALYSIS; GRAIN SIZE; INDIUM OXIDES; LAYERS; MORPHOLOGY; NANOSTRUCTURES; SINTERING; SYNTHESIS; THERMAL GRAVIMETRIC ANALYSIS; TIN OXIDES; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION
- Descriptors DEC
- CHALCOGENIDES; CHEMICAL ANALYSIS; COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; FABRICATION; GRAVIMETRIC ANALYSIS; INDIUM COMPOUNDS; MICROSCOPY; MICROSTRUCTURE; OXIDES; OXYGEN COMPOUNDS; QUANTITATIVE CHEMICAL ANALYSIS; SCATTERING; SIZE; THERMAL ANALYSIS; TIN COMPOUNDS