Modification of polymer composite films using 120 MeV Ni10+ ions
- 1. Department of Physics, M. S. University of Baroda, Vadodara 390002 (India)
- 2. Inter University Accelerator Center, Aruna Asaf Ali Marg, New Delhi 110067 (India)
Description
The films of polymethyl methacrylate (PMMA) were synthesized by solution polymerization technique. Nickel dimethylglyoxime (Ni-DMG) compound was dispersed in polymethyl methacrylate (PMMA) films at different concentrations. These films were irradiated with 120 MeV Ni10+ ions at the fluences of 1 x 1011 and 1 x 1012 ions/cm2. These irradiated films were characterized by means of X-ray diffraction (XRD), Vickers' microhardness tester, atomic force microscopy (AFM) and scanning electron microscopy (SEM). X-ray diffraction patterns revealed that the particle size of Ni-DMG nanoparticles is reduced upon irradiation. It indicates that there is a significant interaction of ion beam with Ni-DMG particles in polymer matrix which leads to deposition of large amount of energy and resulted in splitting/melting of nanometric grains. It also revealed that semi crystalline phase of pristine films has been changed with respect to concentration and with the fluence. It is observed that the hardness of the film increases as fluence increases. This suggests that ion beam irradiation promotes (i) the metal to polymer bonding (ii) convert the polymeric structure in to hydrogen depleted carbon network due to the emission of hydrogen gas and/or other volatile gases. The surface average roughness increases as concentration of filler increases and decreases due to ion beam irradiation as revealed from AFM studies. SEM micrographs show partial agglomeration of filler and flake-like structure upon irradiation
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nimb.2008.01.057Additional details
Identifiers
- DOI
- 10.1016/j.nimb.2008.01.057;
- PII
- S0168-583X(08)00092-X;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 266
- Journal Issue
- 8
- Journal Page Range
- p. 1775-1779
- ISSN
- 0168-583X
- CODEN
- NIMBEU
Conference
- Title
- 18. international conference on ion beam analysis
- Dates
- 23-28 Sep 2007
- Place
- Hyderabad (India)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40013484
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ATOMIC FORCE MICROSCOPY; DIMETHYLGLYOXIME; FILMS; HYDROGEN; ION BEAMS; IONS; IRRADIATION; MEV RANGE; MICROHARDNESS; NICKEL; PMMA; SCANNING ELECTRON MICROSCOPY; X-RAY DIFFRACTION
- Descriptors DEC
- AMINES; BEAMS; CHARGED PARTICLES; COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; ELEMENTS; ENERGY RANGE; ESTERS; HARDNESS; HYDROXY COMPOUNDS; MECHANICAL PROPERTIES; METALS; MICROSCOPY; NONMETALS; ORGANIC COMPOUNDS; ORGANIC NITROGEN COMPOUNDS; ORGANIC POLYMERS; OXIMES; POLYACRYLATES; POLYMERS; POLYVINYLS; REAGENTS; SCATTERING; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.