Published September 2017 | Version v1
Journal article

Electric-field sensor based on a double quantum dot in a microcavity

  • 1. Moscow Institute of Physics and Technology (Russian Federation)

Description

A scheme for an optical quantum external-electric-field sensor based on a double quantum dot placed in a high-Q semiconductor microcavity is proposed. A model of the dynamic processes occurring in this system is developed, its spectral characteristics are investigated, and the noise stability of the sensor is examined. It is demonstrated that, owing to design features, the device has a number of advantages, including high sensitivity, the presence of different excitation and measurement channels, and the possibility of accurate determination of the spatial field distribution.

Additional details

Identifiers

Publishing Information

Journal Title
Semiconductors
Journal Volume
51
Journal Issue
9
Journal Page Range
p. 1200-1207
ISSN
1063-7826
CODEN
SMICES

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
49107418
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
ELECTRIC FIELDS; LABELLING; MASS SPECTROSCOPY; NUCLEAR MAGNETIC RESONANCE; QUANTUM DOTS; SEMICONDUCTOR MATERIALS; SENSORS; SPATIAL DISTRIBUTION
Descriptors DEC
DISTRIBUTION; MAGNETIC RESONANCE; MATERIALS; NANOSTRUCTURES; RESONANCE; SPECTROSCOPY

Optional Information

Copyright
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