Published September 2017
| Version v1
Journal article
Electric-field sensor based on a double quantum dot in a microcavity
Creators
- 1. Moscow Institute of Physics and Technology (Russian Federation)
Description
A scheme for an optical quantum external-electric-field sensor based on a double quantum dot placed in a high-Q semiconductor microcavity is proposed. A model of the dynamic processes occurring in this system is developed, its spectral characteristics are investigated, and the noise stability of the sensor is examined. It is demonstrated that, owing to design features, the device has a number of advantages, including high sensitivity, the presence of different excitation and measurement channels, and the possibility of accurate determination of the spatial field distribution.
Additional details
Identifiers
Publishing Information
- Journal Title
- Semiconductors
- Journal Volume
- 51
- Journal Issue
- 9
- Journal Page Range
- p. 1200-1207
- ISSN
- 1063-7826
- CODEN
- SMICES
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 49107418
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ELECTRIC FIELDS; LABELLING; MASS SPECTROSCOPY; NUCLEAR MAGNETIC RESONANCE; QUANTUM DOTS; SEMICONDUCTOR MATERIALS; SENSORS; SPATIAL DISTRIBUTION
- Descriptors DEC
- DISTRIBUTION; MAGNETIC RESONANCE; MATERIALS; NANOSTRUCTURES; RESONANCE; SPECTROSCOPY
Optional Information
- Copyright
- Copyright (c) 2017 Pleiades Publishing, Ltd.