Improved dielectric properties of Na1/2Y1/2Cu3Ti4O12 ceramics synthesized by ball-milling and reactive sintering
- 1. Department of Physics, College of Science, King Faisal University, Al-Ahsa 31982 (Saudi Arabia)
Description
Na1/2Y1/2Cu3Ti4O12 (NYCTO) ceramics with giant dielectric constant (ε′) were synthesized by simple reactive sintering. NYCTO nanopowder was first synthesized using high energy ball-mill. Then the pelletized powder was sintered in air at temperatures in the range 975 °C to 1050 °C for 10–20 h. The obtained ceramics showed pure CaCu3Ti4O12 (CCTO)-like cubic phase as revealed by x-ray diffraction measurements. Field effect-SEM observations showed that the grain size increases from 2 μm to 5 μm with increasing sintering temperature. NYCTO samples sintered at temperatures higher than 975 °C showed giant dielectric constant (103–104) over most of the frequency range. The minimum dielectric loss (tanδ) of ∼0.055 at 300 K has been approved for the ceramic sample sintered at 1050 °C. Impedance and modulus spectra of the current samples showed two relaxations related to semiconductor (grain) and high resistance (grain-boundaries) elements. The activation energy for conduction located in the range 0.1–0.5 eV highlighted the role of single ionized oxygen vacancies in the dielectric properties of the investigated NYCTO ceramics. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/2053-1591/ab73fbAdditional details
Identifiers
Publishing Information
- Journal Title
- Materials Research Express (Online)
- Journal Volume
- 7
- Journal Issue
- 2
- Journal Page Range
- [9 p.]
- ISSN
- 2053-1591
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 52107023
- Subject category
- S36: MATERIALS SCIENCE; S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Descriptors DEI
- ACTIVATION ENERGY; CERAMICS; DIELECTRIC MATERIALS; DIELECTRIC PROPERTIES; FREQUENCY RANGE; GRAIN BOUNDARIES; GRAIN SIZE; NANOPOWDERS; NANOSTRUCTURES; SCANNING ELECTRON MICROSCOPY; SPECTRA; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; ELECTRICAL PROPERTIES; ELECTRON MICROSCOPY; ENERGY; MATERIALS; MICROSCOPY; MICROSTRUCTURE; NANOMATERIALS; PHYSICAL PROPERTIES; POWDERS; SCATTERING; SIZE