Design, properties, and TFT application of solution-processed In-Ga-Cd-O thin films
Creators
- 1. Nano Science and Technology Institute, University of Science and Technology of China, Suzhou (China)
- 2. Key Laboratory of Graphene Technologies and Applications of Zhejiang Province and Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo (China)
- 3. Department of Physics, Government College University Faisalabad (Pakistan)
- 4. State Key Laboratory of Luminescent Materials and Devices, South China University of Technology, Guangzhou (China)
- 5. Department of Physics, National Sun Yat-Sen University, Kaohsiung (China)
Description
Concerning the revolutionary future of electronic devices, high-performance solution-processable semiconductors have earned increasing academic and industrial research interests. In this paper, we synthesize In-Ga-Cd-O semiconductor thin films via a solution method. Transparent amorphous/nanocrystalline oxide thin films with small surface roughness have been grown by controlling the relative ratio of Cd-content. The present thin-film transistor with an optimized Cd-ratio exhibits a saturation field-effect mobility up to 10 cm2 V-1 s-1, an on/off current ratio of ∼1.3 x 109, and a threshold voltage shift of ∼2.6 V under -5 V gate bias of 10 000 s, which are superior or comparable to those reported values of solution-processed conventional In-Ga-Zn-O counterparts. Our results indicate that the proposed In-Ga-Cd-O semiconductor would endow a promising transparent amorphous/nanocrystalline active material for electronic devices. (copyright 2018 WILEY-VCH Verlag GmbH and Co. KGaA, Weinheim)
Availability note (English)
Available from: http://dx.doi.org/10.1002/pssr.201800034Additional details
Identifiers
Publishing Information
- Journal Title
- Physica Status Solidi. Rapid Research Letters (Online)
- Journal Volume
- 12
- Journal Issue
- 5
- Journal Page Range
- p. 1-7
- ISSN
- 1862-6270
- CODEN
- PSSRCS
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 49070929
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- AMORPHOUS STATE; ATOMIC FORCE MICROSCOPY; CADMIUM OXIDES; DIFFERENTIAL THERMAL ANALYSIS; ELECTRON MOBILITY; ENERGY-LEVEL DENSITY; FIELD EFFECT TRANSISTORS; GALLIUM OXIDES; INDIUM OXIDES; NANOSTRUCTURES; OPACITY; SEMICONDUCTOR MATERIALS; SYNTHESIS; TEMPERATURE RANGE 0273-0400 K; TEMPERATURE RANGE 0400-1000 K; THERMAL GRAVIMETRIC ANALYSIS; THIN FILMS; X-RAY DIFFRACTION
- Descriptors DEC
- CADMIUM COMPOUNDS; CHALCOGENIDES; CHEMICAL ANALYSIS; COHERENT SCATTERING; DIFFRACTION; FILMS; GALLIUM COMPOUNDS; GRAVIMETRIC ANALYSIS; INDIUM COMPOUNDS; MATERIALS; MICROSCOPY; MOBILITY; OPTICAL PROPERTIES; OXIDES; OXYGEN COMPOUNDS; PARTICLE MOBILITY; PHYSICAL PROPERTIES; QUANTITATIVE CHEMICAL ANALYSIS; SCATTERING; SEMICONDUCTOR DEVICES; TEMPERATURE RANGE; THERMAL ANALYSIS; TRANSISTORS
Optional Information
- Notes
- With 6 figs., 1 tab.