Published 1975
| Version v1
Report
Open
X-ray diffraction study of niobium-base superconductive thin films
Description
no abstract available
Availability note (English)
MF available from INIS under the Report Number.Files
7222748.pdf
Files
(282.8 kB)
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System files
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Additional details
Additional titles
- Original title (Russian)
- Рентгеновский анализ сверхпроводящих тонких пленок на основе ниобия
Publishing Information
- Imprint Pagination
- 9 p.
- Report number
- JINR--9-8605
INIS
- Country of Publication
- USSR
- Country of Input or Organization
- USSR
- INIS RN
- 7222748
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- COPPER; CRYSTAL STRUCTURE; DIAGRAMS; FILMS; GRAIN ORIENTATION; LATTICE PARAMETERS; NIOBIUM BASE ALLOYS; SUBSTRATES; SUPERCONDUCTORS; TEXTURE; THICKNESS; TITANIUM COMPOUNDS; X-RAY DIFFRACTION
- Descriptors DEC
- ALLOYS; COHERENT SCATTERING; DIFFRACTION; DIMENSIONS; ELEMENTS; METALS; MICROSTRUCTURE; NIOBIUM ALLOYS; ORIENTATION; SCATTERING; TRANSITION ELEMENT ALLOYS; TRANSITION ELEMENT COMPOUNDS; TRANSITION ELEMENTS
Optional Information
- Notes
- 2 refs.; 4 figs.