Published August 1975
| Version v1
Journal article
Detection of surface nitrogen in high-T/subc/ Nb3Ge films by Auger analysis
Description
Auger electron spectroscopy was applied to Nb3Ge films that possessed T/subc/'s above 200K. The surface composition was determined from the Auger spectra. A considerable amount of nitrogen was detected on the surface. This amount, which varied by a factor of 3 across the surface, was 100 times higher than the nitrogen concentration in the film. The discrepancy is tentatively assigned to the effect of argon-ion sputter cleaning prior to the Auger measurements
Additional details
Identifiers
- DOI
- 10.1063/1.322086;
Publishing Information
- Journal Title
- Journal of Applied Physics
- Journal Volume
- 46
- Journal Issue
- 8
- Series
- J. Appl. Phys.
- Journal Page Range
- 3614-3618
- ISSN
- 0021-8979
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 7227845
- Subject category
- S36: MATERIALS SCIENCE; S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Descriptors DEI
- ARGON IONS; AUGER EFFECT; CHEMICAL ANALYSIS; CHEMICAL COMPOSITION; ELECTRON SPECTROSCOPY; FILMS; GERMANIUM ALLOYS; MASS SPECTROSCOPY; NIOBIUM BASE ALLOYS; NIOBIUM NITRIDES; NITROGEN; QUANTITATIVE CHEMICAL ANALYSIS; SPUTTERING; SUPERCONDUCTORS; SURFACE CLEANING; SURFACE CONTAMINATION
- Descriptors DEC
- ALLOYS; CHARGED PARTICLES; CLEANING; CONTAMINATION; ELEMENTS; IONS; NIOBIUM ALLOYS; NIOBIUM COMPOUNDS; NITRIDES; NITROGEN COMPOUNDS; NONMETALS; SPECTROSCOPY; SURFACE FINISHING; TRANSITION ELEMENT ALLOYS; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Notes
- Updated automatically by Metadata and Full-Text Enrichment Agent