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Published July 2023 | Version v1
Journal article Metadata-only

Multi-beam X-ray optical system for high-speed tomography using a σ-polarization diffraction geometry

Creators

  • 1. Tokyo Gakugei University, Faculty of Education, Koganei, Tokyo (Japan)
  • 2. Tohoku University, Institute of Multidisciplinary Research for Advanced Materials (IMRAM), Sendai, Miyagi (Japan)
  • 3. National Institute of Advanced Industrial Science and Technology (AIST), Research Institute for Material and Chemical Measurement, Tsukuba, Ibaraki (Japan)
  • 4. High Energy Accelerator Research Organization (KEK), Institute of Materials Structure Science, Photon Factory, Tsukuba, Ibaraki (Japan)
  • 5. University of Tsukuba, Institute of Systems and Information Engineering, Tsukuba, Ibaraki (Japan)

Description

A multi-beam X-ray optical system using a σ-polarization diffraction geometry is proposed and its potential for high-speed tomography using synchrotron radiation is experimentally evaluated. Projection images of a sample are obtained simultaneously from different directions with X-ray beams generated by diffraction of a white synchrotron radiation beam at silicon single crystals. This makes it possible to record a tomographic dataset without rotation of the sample or X-ray source. Data sets of two samples obtained in a proof-of-principle experiment with an exposure time of 1 ms were successfully reconstructed using an advanced compressed-sensing algorithm. (author)

Additional details

Identifiers

DOI
10.35848/1882-0786/ace5a5;

Publishing Information

Journal Title
Applied Physics Express (Online)
Journal Volume
16
Journal Issue
7
Journal Page Range
p. 072007.1-072007.4
ISSN
1882-0786

INIS

Country of Publication
Japan
Country of Input or Organization
Japan
INIS RN
55044127
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
BRAGG REFLECTION; CMOS CIRCUITS; COMPUTERIZED TOMOGRAPHY; DATASETS; OPTICAL SYSTEMS; PARTICLE BEAMS; POLARIZATION; SPATIAL RESOLUTION; TIME RESOLUTION; X-RAY DIFFRACTION
Descriptors DEC
BEAMS; COHERENT SCATTERING; DIAGNOSTIC TECHNIQUES; DIFFRACTION; DOCUMENT TYPES; ELECTRONIC CIRCUITS; INTEGRATED CIRCUITS; MICROELECTRONIC CIRCUITS; REFLECTION; RESOLUTION; SCATTERING; TIMING PROPERTIES; TOMOGRAPHY

Optional Information

Notes
29 refs., 4 figs.