Published 2019
| Version v1
Journal article
Annealing and Characterization of Irradiated Low Gain Avalanche Detectors
Creators
- 1. Albert-Ludwigs Universität Freiburg (Germany)
- 2. CERN (Switzerland)
- 3. Universidad de Cantabria (Spain)
- 4. European Organization for Nuclear Research, Geneva (Switzerland)
- 5. Universidad de Santiago de Compostela (Spain)
- 6. Universitat de Barcelona (Spain)
Description
Irradiated Low Gain Avalanche Detectors (LGADs) are investigated using the Transient Current Technique (TCT) and IV/CV measurements. The sensors are irradiated to a fluence of $10^{14}$ $n_{eq}/cm^2$. For different annealing times (at 60 °C), the collected charge, the gain and the electric field profile is measured.
Availability note (English)
Available from: https://www.dpg-verhandlungen.de/Additional details
Identifiers
Publishing Information
- Journal Title
- Verhandlungen der Deutschen Physikalischen Gesellschaft
- Journal Issue
- Aachen 2019 issue
- Journal Page Range
- [1 p.]
- ISSN
- 0420-0195
- CODEN
- VDPEAZ
Conference
- Title
- Particle physics, didactics of physics, working group jDPG, working group physics, modern information technology and artificial intelligence
- Original Conference Title
- DPG-Fruehjahrstagung 2019 mit den folgenden Fachverbaenden und Arbeitskreisen: Teilchenphysik, Didaktik der Physik, Arbeitskreis jDPG, Arbeitskreis Physik, moderne Informationstechnologie und Kuenstliche Intelligenz
- Acronym
- DPG Spring meeting 2019 of the following divisions und working groups
- Dates
- 25-29 Mar 2019
- Place
- Aachen (Germany)
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 51001710
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ANNEALING; CAPACITANCE; CHARGE COLLECTION; ELECTRIC CONDUCTIVITY; ELECTRIC FIELDS; GAIN; PHYSICAL RADIATION EFFECTS; PROPORTIONAL COUNTERS; TEMPERATURE RANGE 0273-0400 K; TRANSIENTS
- Descriptors DEC
- AMPLIFICATION; ELECTRICAL PROPERTIES; HEAT TREATMENTS; MEASURING INSTRUMENTS; PHYSICAL PROPERTIES; RADIATION DETECTORS; RADIATION EFFECTS; TEMPERATURE RANGE
Optional Information
- Notes
- Session: T 27.10 Di 18:15; Also available as printed version: Verhandlungen der Deutschen Physikalischen Gesellschaft v. 54(3)