Surface plasmon resonance in nanocrystalline silver particles embedded in SiO2 matrix
Creators
- 1. Inter University Consortium for DAE Facilities, Sector-III, Block-LB/8, Bidhan Nagar, Calcutta (India)
- 2. Department of Materials Science, Indian Association for the Cultivation of Science, Calcutta (India)
Description
Nanocomposite films containing silver particles embedded in SiO2 matrix were prepared by high pressure (∼40 Pa) d.c. sputtering technique in an argon plasma on fused silica substrate. Particle size and metal volume fraction were tailored by varying the substrate temperature (Ts∼233-300 K) and deposition time (15-240 s). Reduction in size and volume fraction of metal particles culminated in blue-shift of the surface plasmon resonance peak in the optical absorbance spectra of the films. Absence of surface plasmon peak in the absorption spectra below a critical particle size and metal concentration of the nanocomposite films and appearance of sharp absorption edge in the absorbance spectra within the UV-VIS range indicated the semiconducting behaviour of the ultrafine silver particles. Experimental absorbance spectra were theoretically simulated by Mie scattering theory and Maxwell-Garnett effective medium theory. (author)
Availability note (English)
Available online at the Web site for the Journal of Physics. D, Applied Physics (ISSN 1361-6463) http://www.iop.org/Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. D, Applied Physics
- Journal Volume
- 35
- Journal Issue
- 17
- Journal Page Range
- p. 2198-2205
- ISSN
- 0022-3727
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 33061838
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ABSORPTION SPECTRA; FILMS; PARTICLES; PLASMONS; SCATTERING; SILICON OXIDES; SILVER; TEMPERATURE DEPENDENCE
- Descriptors DEC
- CHALCOGENIDES; ELEMENTS; METALS; OXIDES; OXYGEN COMPOUNDS; QUASI PARTICLES; SILICON COMPOUNDS; SPECTRA; TRANSITION ELEMENTS