Published 2004
| Version v1
Miscellaneous
Potentiometric and spectrophotometric study of the temperature effects on complexation. The uranyl-sulphate (OU22+/SO42-) system in the range 5 deg C - 85 deg C at 1 and 3 m ionic strength
Creators
- 1. Salerno Univ. (Italy). Analytical Chemistry Dept.
- 2. Univ. Politecnica de Catalunya, Barcelona (Spain). Engineering Chemical Dept.
- 3. Barcelona Univ. (Spain). Analytical Chemistry Dept.
- 4. Univ. Politecnica de Catalunya, Manresa Technological Center, Manresa (Spain). Environmental Technology Area
Description
A large effort is under way in order to compile, select and improve the uranium thermodynamic database, however only few thermodynamic data are available at temperatures higher than 25 C. This lack of data is mainly due to the experimental difficulties related to the complexation studies at high temperature. (orig.)
Additional details
Publishing Information
- ISBN
- 3-89336-362-9
- Imprint Title
- Advances in nuclear and radiochemistry. Extended abstracts
- Imprint Pagination
- 831 p.
- Journal Volume
- 3
- Series
- Schriften des Forschungszentrums Juelich. Reihe Allgemeines und Interdisziplinaeres
- Journal Page Range
- p. 100-101
- ISSN
- 1433-5565
- Report number
- INIS-DE--0228
Conference
- Title
- 6. international conference on nuclear and radiochemistry
- Acronym
- NRC 6
- Dates
- 29 Aug - 3 Sep 2004
- Place
- Aachen (Germany)
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 38065325
- Subject category
- S38: RADIATION CHEMISTRY, RADIOCHEMISTRY AND NUCLEAR CHEMISTRY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CHEMICAL REACTION KINETICS; CHEMICAL STATE; CONCENTRATION RATIO; POTENTIOMETRY; SPECTROPHOTOMETRY; SULFATES; TEMPERATURE DEPENDENCE; URANYL COMPLEXES
- Descriptors DEC
- ACTINIDE COMPLEXES; CHEMICAL ANALYSIS; COMPLEXES; DIMENSIONLESS NUMBERS; KINETICS; OXYGEN COMPOUNDS; QUANTITATIVE CHEMICAL ANALYSIS; REACTION KINETICS; SULFUR COMPOUNDS; TITRATION; URANIUM COMPLEXES; VOLUMETRIC ANALYSIS