Simultaneous quick measurements of combined synchrotron EDXAFS and EDXRD

[Background] X-ray absorption fine structure (XAFS) and X-ray diffraction (XRD) are the commonly used techniques to determine the short-range and long-range order of atomic arrangement in materials. [Purpose] This study aims to perform XAFS and XRD measurements quickly and simultaneously for in situ kinetic structural investigation. [Methods] A method of combining synchrotron energy-dispersive X-ray absorption fine structure (EDXAFS) and energy-dispersive X-ray diffraction (EDXRD) was proposed. The white light of synchrotron radiation was used that could theoretically provide microsecond scale representation speed and time resolution. [Results and Conclusions] With a potential temporal resolution of micron seconds, this strategy provides a possibility for quick and simultaneous characterization of short-and long-range structural information of materials that sheds light on in-situ real-time investigation of structural evolution in materials in real conditions. (authors)