Published December 2017
| Version v1
Journal article
Electron beam treatment of tungsten mock-ups
Creators
- 1. A.N. Frumkin Institute of Physical Chemistry and Electrochemistry, Moscow (Russian Federation)
- 2. Ioffe Institute, St. Petersburg (Russian Federation)
- 3. JSC 'D.V. Efremov Institute of Electrophysical Apparatus', St. Petersburg (Russian Federation)
Description
To simulate thermal loads in ITER several tungsten (W) water cooled mock-ups were treated by a scanning electron beam (Tsefey-M) at a heat flux up to 1.68 GW m−2 for a duration of 18 μ s and a frequency about 30 kHz. Surface morphology, chemical composition, structure, and microhardness of formed W layers were analyzed by SEM, EPMA, XRD, OM, and Vickers hardness tester. The irradiation treatment resulted in W melting to a depth of 0.3 mm, increasing sub-surface grain sizes, grain ordering in the metal bulk, deep cracking, and decreasing of microhardness to a depth of 2–4 mm. Installation of the pre-damaged W samples in a tokamak Globus-M divertor did not change practically discharge conditions. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1402-4896/aa8b00Additional details
Identifiers
Publishing Information
- Journal Title
- Physica Scripta (Online)
- Journal Volume
- 2017
- Journal Issue
- T170
- Journal Page Range
- [5 p.]
- ISSN
- 1402-4896
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 49032486
- Subject category
- S36: MATERIALS SCIENCE; S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Descriptors DEI
- CHEMICAL COMPOSITION; CRACKING; DIVERTORS; ELECTRON BEAMS; ELECTRON MICROPROBE ANALYSIS; GRAIN SIZE; HEAT FLUX; ITER TOKAMAK; KHZ RANGE; LAYERS; MICROHARDNESS; MORPHOLOGY; RADIATION EFFECTS; SCANNING ELECTRON MICROSCOPY; SURFACES; TUNGSTEN; VICKERS HARDNESS; X-RAY DIFFRACTION
- Descriptors DEC
- BEAMS; CHEMICAL ANALYSIS; CHEMICAL REACTIONS; CLOSED PLASMA DEVICES; COHERENT SCATTERING; DECOMPOSITION; DIFFRACTION; ELECTRON MICROSCOPY; ELEMENTS; FREQUENCY RANGE; HARDNESS; LEPTON BEAMS; MECHANICAL PROPERTIES; METALS; MICROANALYSIS; MICROSCOPY; MICROSTRUCTURE; NONDESTRUCTIVE ANALYSIS; PARTICLE BEAMS; PYROLYSIS; REFRACTORY METALS; SCATTERING; SIZE; THERMOCHEMICAL PROCESSES; THERMONUCLEAR DEVICES; THERMONUCLEAR REACTORS; TOKAMAK DEVICES; TOKAMAK TYPE REACTORS; TRANSITION ELEMENTS