Published May 2012 | Version v1
Journal article

Physical modeling based on hydrodynamic simulation for the design of InGaAs/InP double heterojunction bipolar transistors

  • 1. Key Laboratory of Microelectronics Device and Integrated Technology Institute of Microelectronics, Chinese Academy of Sciences, Beijing 100029 (China)

Description

A physical model for scaling and optimizing InGaAs/InP double heterojunction bipolar transistors (DHBTs) based on hydrodynamic simulation is developed. The model is based on the hydrodynamic equation, which can accurately describe non-equilibrium conditions such as quasi-ballistic transport in the thin base and the velocity overshoot effect in the depleted collector. In addition, the model accounts for several physical effects such as bandgap narrowing, variable effective mass, and doping-dependent mobility at high fields. Good agreement between the measured and simulated values of cutoff frequency, ft, and maximum oscillation frequency, fmax, are achieved for lateral and vertical device scalings. It is shown that the model in this paper is appropriate for downscaling and designing InGaAs/InP DHBTs. (interdisciplinary physics and related areas of science and technology)

Availability note (English)

Available from http://dx.doi.org/10.1088/1674-1056/21/5/058501

Additional details

Publishing Information

Journal Title
Chinese Physics. B
Journal Volume
21
Journal Issue
5
Journal Page Range
[6 p.]
ISSN
1674-1056