Published 1987
| Version v1
Journal article
Reader annealing of LiF chips
Description
An experimental investigation is described into the effects of repeated measurement and annealing in a thermoluminescence reader on the sensitivity and background of LiF:Mg, Ti (TLD-100) chips. It is shown that under certain experimental conditions an absorbed dose threshold of 5 μ Gy can be achieved with a batch of chips receiving only a reader anneal at 4000C. (author)
Additional details
Publishing Information
- Journal Title
- Radiat. Prot. Dosim.
- Journal Volume
- 18
- Journal Issue
- 2
- Series
- Radiat. Prot. Dosim.
- Journal Page Range
- 99-100
- ISSN
- 0144-8420
- CODEN
- RPDOD
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- United Kingdom
- INIS RN
- 18080718
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S36: MATERIALS SCIENCE;
- Descriptors DEI
- ANNEALING; LITHIUM FLUORIDES; SENSITIVITY; THERMOLUMINESCENT DOSEMETERS
- Descriptors DEC
- ALKALI METAL COMPOUNDS; DOSEMETERS; FLUORIDES; FLUORINE COMPOUNDS; HALIDES; HALOGEN COMPOUNDS; HEAT TREATMENTS; LITHIUM COMPOUNDS; LITHIUM HALIDES; LUMINESCENT DOSEMETERS; MEASURING INSTRUMENTS