Published May 2016 | Version v1
Journal article

Study of the VMM1 read-out chip in a neutron irradiation environment

  • 1. Department of Physics, National Technical University of Athens, Zografou Campus, Athens (Greece)
  • 2. Institute of Nuclear and Particle Physics, NCSR ''Demokritos'', Patriarchou Grigoriou E' and Neapoleos 27, Athens (Greece)
  • 3. Department of Financial and Management Engineering, University of the Aegean, Kountouriotou 41, Chios (Greece)

Description

Within 2015, the LHC operated close to the design energy of √ s  = 13–14 TeV delivering instantaneous luminosities up to L = 5 × 1033 cm−2s−1. The ATLAS Phase-I upgrade in 2018/19 will introduce the MicroMEGAS detectors in the area of the small wheel at the end caps. Accompanying new electronics are designed and built such as the VMM front end ASIC, which provides energy, timing and triggering information and allows fast data read-out. The first VMM version (VMM1) has been widely produced and tested in various test beams, whilst the second version (VMM2) is currently being tested. This paper focuses on the VMM1 single event upset studies and more specifically on the response of the configuration registers under harsh radiation environments. Similar conditions are expected at Run III with L = 2 × 1034 cm−2s−1 and a mean of 55 interactions per bunch crossing. Two VMM1s were exposed in a neutron irradiation environment using the TANDEM Van Der Graaff accelerator at NSCR Demokritos, Athens, Greece. The results showed a rate of SEU occurrences at a measured cross section of (4.1±0.8)×10−14 cm2/bit for each VMM. Consequently, when extrapolating this value to the luminosity expected in Run III, the occurrence is roughly 6 SEUs/min in all the read-out system comprising 40,000 VMMs installed during the Phase-I upgrade.

Availability note (English)

Available from http://dx.doi.org/10.1088/1748-0221/11/05/P05015

Additional details

Publishing Information

Journal Title
Journal of Instrumentation
Journal Volume
11
Journal Issue
05
Journal Page Range
p. P05015
ISSN
1748-0221