Application of X-ray diffraction topography with a monochromatic divergent beam to the study of distorted crystals

Topography with a monochromatic divergent beam is shown to be a useful method of imaging mosaic and deformed crystals and measuring their distortions. Some properties of the method are derived theoretically and verified experimentally. The focusing of the diffracted beam can take place in one of the possible crystal settings, if appropriate parameters are chosen. Misorientations in a range from several tens of seconds of arc up to several tens of minutes can be measured. Some applications of the method are shown. (orig.)