Published April 2015
| Version v1
Journal article
Accuracy of focus wedge mark measurement using fitting function for partially coherent illumination
- 1. Nikon Corporation, Core Technology Division, Saitama (Japan)
- 2. Nikon Corporation, Semiconductor Lithography Business Unit, Saitama (Japan)
Description
The theory of best focus determination in focus wedge mark (FWM) metrology is extended from coherent illumination to partially coherent illumination. Through a theoretical analysis, we propose a focus curve fitting function suitable for the FWM, which is expressed by the sinc function. The experimental results for best focus estimations using two types of fitting functions, which are a conventional quadratic polynomial and the proposed sinc function, are reported for various defocus regions to be fitted. When the first inflection points of the sinc function are included in the fitting defocus region, we can achieve stable best focus estimation within 3 nm in our i-line exposure experiments. (author)
Availability note (English)
Available from http://dx.doi.org/10.7567/JJAP.54.046701Additional details
Identifiers
Publishing Information
- Journal Title
- Japanese Journal of Applied Physics
- Journal Volume
- 54
- Journal Issue
- 4
- Journal Page Range
- p. 046701.1-046701.8
- ISSN
- 0021-4922
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 46134468
- Subject category
- S43: PARTICLE ACCELERATORS;
- Descriptors DEI
- ARGON FLUORIDES; BEAM OPTICS; COMPUTERIZED SIMULATION; EQUATIONS; EXCIMER LASERS; FOCUSING; ILLUMINANCE; MASKING; OPTICAL MODELS; ORBIT STABILITY
- Descriptors DEC
- ARGON COMPOUNDS; ARGON HALIDES; FLUORIDES; FLUORINE COMPOUNDS; GAS LASERS; HALIDES; HALOGEN COMPOUNDS; LASERS; MATHEMATICAL MODELS; RARE GAS COMPOUNDS; SIMULATION; STABILITY
Optional Information
- Notes
- 30 refs., 10 figs.