Published June 1982
| Version v1
Journal article
Microprocessor data acquisition and evaluation system for energy dispersive X-ray spectrometer
Creators
- 1. Magyar Tudomanyos Akademia Atommag Kutato Intezete, Debrecen
Description
X-ray emission analysis generally requires a multichannel analyzer and a minicomputer. The new system developed in ATOMKI (Debrecen, Hungary) is based on an INTEL 8080A microprocessor. It is much cheaper and can adequately control the process of data acquisition and evaluation. The program of the microprocessor is written in Assembly and it controls the spectral data acquisition by ADC and visualizes the spectrum on display. Some manipulations on the displayed spectrum are also possible. The system is capable of measuring total X-ray intensity as well as analysing the Au, Ag, Pt, Cu, etc. content of jewels and the Ca content of human hair. (D.Gy.)
Additional details
Additional titles
- Original title (Hungarian)
- Mikroprocesszoros adatgyuejtoe es kiertekeloe rendszer energiadiszperziv roentgenspektrometerhez
Publishing Information
- Journal Title
- ATOMKI (At. Kut. Intez.) Koezl.
- Journal Volume
- 24
- Journal Issue
- suppl. 3
- Series
- ATOMKI (At. Kut. Intez.) Koezl.
- Journal Page Range
- 16-19
- ISSN
- 0004-7155
Conference
- Title
- Application of X-ray fluorescence spectral analysis in industry, research and environmental protection.
- Dates
- 5 - 6 Apr 1982.
- Place
- Miskolc-Egyetemvaros, Hungary.
INIS
- Country of Publication
- Hungary
- Country of Input or Organization
- Hungary
- INIS RN
- 13703636
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- DATA ACQUISITION SYSTEMS; DATA PROCESSING; FLOWSHEETS; MICROPROCESSORS; X-RAY FLUORESCENCE ANALYSIS; X-RAY FLUORESCENCE ANALYZERS; X-RAY SPECTRA; X-RAY SPECTROMETERS
- Descriptors DEC
- CHEMICAL ANALYSIS; DIAGRAMS; ELECTRONIC CIRCUITS; INFORMATION; MEASURING INSTRUMENTS; MICROELECTRONIC CIRCUITS; NONDESTRUCTIVE ANALYSIS; SPECTRA; SPECTROMETERS; X-RAY EMISSION ANALYSIS