Published 1975 | Version v1
Report Metadata-only

An apparatus for the study of ion and photon emission from ion bombarded surfaces. Pt. 1

Creators

  • 1. Australian National Univ., Canberra. Dept. of Physics

Description

Secondary ion, secondary electron and photon emission represent inelastic effects in the collision processes occurring at ion-bombarded surfaces. Such effects have become of interest, both for their fundamental importance to the understanding of ion-surface interaction and also for their potential in surface analysis. In this paper a new system for the study of photon and secondary ion emission is described and some preliminary results of experiments are presented. (orig./GSCH)

Abstract (German)

Sekundaerionen-, Sekundaerelektronen- und Photonenemission stellen inelastische Effekte in Stossprozessen dar, die auf ionenbestrahlten Oberflaechen entstehen. Solche Effekte sind interessant geworden wegen ihrer fundamentalen Bedeutung fuer das Verstehen der Wechselwirkung Ion-Oberflaeche, als auch wegen ihrer moeglichen Anwendung in der Oberflaechenanalyse. In dieser Arbeit wird ein neues System zum Studium der Photonen- und Sekundaerionen-Emission beschrieben, und einige vorlaeufige Messresultate werden mitgeteilt. (orig./GSCH)

Additional details

Additional titles

Subtitle (English)
Some preliminary results

Publishing Information

Imprint Pagination
12 p.
Report number
AED-Conf--75-478-001

Conference

Title
2. international conference on ion beam surface layer analysis.
Dates
15 Sep 1975.
Place
Karlsruhe, F.R. Germany.

INIS

Country of Publication
Germany
Country of Input or Organization
Germany
INIS RN
7256683
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference, Non-conventional Literature
Descriptors DEI
ALUMINIUM; ARGON 40 BEAMS; COPPER; ENERGY RESOLUTION; ENERGY SPECTRA; ION EMISSION; ION PROBES; MASS RESOLUTION; MASS SPECTRA; MASS SPECTROMETERS; SECONDARY EMISSION; SECONDARY EMISSION DETECTORS; SURFACES
Descriptors DEC
BEAMS; ELEMENTS; EMISSION; ION BEAMS; MEASURING INSTRUMENTS; METALS; PROBES; RADIATION DETECTORS; RESOLUTION; SPECTRA; SPECTROMETERS; TRANSITION ELEMENTS

Optional Information

Notes
8 figs.; 1 tab.; 14 refs. Available from ZAED.