Published May 25, 2015 | Version v1
Journal article

Optical and electrical properties of Mg-doped AlN nanowires grown by molecular beam epitaxy

  • 1. Department of Electrical and Computer Engineering, McGill University, 3480 University Street, Montreal, Quebec H3A 0E9 (Canada)
  • 2. Department of Electrical and Computer Engineering, Texas Tech University, Lubbock, Texas 79409 (United States)

Description

In this paper, the optical and electrical properties of Mg-doped AlN nanowires are discussed. At room temperature, with the increase of Mg-doping concentration, the Mg-acceptor energy level related optical transition can be clearly measured, which is separated about 0.6 eV from the band-edge transition, consistent with the Mg activation energy in AlN. The electrical conduction measurements indicate an activation energy of 23 meV at 300 K–450 K temperature range, which is significantly smaller than the Mg-ionization energy in AlN, suggesting the p-type conduction being mostly related to hopping conduction. The free hole concentration of AlN:Mg nanowires is estimated to be on the order of 1016 cm−3, or higher

Additional details

Identifiers

Publishing Information

Journal Title
Applied Physics Letters
Journal Volume
106
Journal Issue
21
Journal Page Range
p. 213105-213105.5
ISSN
0003-6951
CODEN
APPLAB

Optional Information

Notes
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