Published June 2004
| Version v1
Journal article
An Excel utility for the rapid characterization of 'funny filters' in PIXE analysis
Creators
Description
'Funny filters', i.e. compound absorbers with an aperture in one layer, provide an effective means of recording both trace and major element X-ray lines in a single PIXE spectrum. However, the characterization of funny filters has some pitfalls. An Excel utility has been developed to characterize the physical parameters of the filter on the assumption of a constant H-value for the PIXE system. Its application is illustrated using data taken independently at two laboratories
Additional details
Identifiers
- DOI
- 10.1016/j.nimb.2004.01.041;
- PII
- S0168583X04000692;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 219-220
- Journal Issue
- 4
- Journal Page Range
- p. 136-139
- ISSN
- 0168-583X
- CODEN
- NIMBEU
Conference
- Title
- 16. international conference on ion beam analysis
- Dates
- 29 Jun - 4 Jul 2003
- Place
- Albuquerque, NM (United States)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Mexico
- INIS RN
- 35079115
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BREMSSTRAHLUNG; CALIBRATION; COMPUTER CODES; DATA; DIAGRAMS; E CODES; FILTERS; LAYERS; LI-DRIFTED SI DETECTORS; PIXE ANALYSIS; USES
- Descriptors DEC
- CHEMICAL ANALYSIS; COMPUTER CODES; ELECTROMAGNETIC RADIATION; INFORMATION; LI-DRIFTED DETECTORS; MEASURING INSTRUMENTS; NONDESTRUCTIVE ANALYSIS; RADIATION DETECTORS; RADIATIONS; SEMICONDUCTOR DETECTORS; SI SEMICONDUCTOR DETECTORS; X-RAY EMISSION ANALYSIS
Optional Information
- Copyright
- Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.