Investigation of reordered (001) Au surfaces by positive ion channeling spectroscopy, LEED and AES

As a consequence of the channeling phenomenon of positive ions in single crystals, the yield of ions Rutherford scattered from an oriented single crystal surface is dependent on the density of surface atoms exposed to the incident ion beam. Thus, the positive ion channeling spectroscopy (PICS) technique should provide a useful tool for studying reordered surfaces. This possibility was explored by examining the surfaces of epitaxially grown thin Au single crystals with the combined techniques of LEED-AES and PICS. The LEED and AES investigations showed that when the (001) surface was sputter cleaned in ultra-high vacuum, the normal (1 x 1) symmetry of the (001) surfaces reordered into a structure which gave a complex (5 x 20) LEED pattern. The yield and energy distributions of 1 MeV He ions scattered from the Au surfaces were used to determine the number of effective monolayers contributing to the normal and reordered surfaces. These combined measurements were used to characterize the nature of the reordered surface. The general applicability of the PICS technique for investigations of surface and near surface regions is discussed