Improved efficiency droop characteristics in an InGaN/GaN light-emitting diode with a novel designed last barrier structure
Creators
- 1. Beijing Key Laboratory of New and Renewable Energy North China Electric Power University, Beijing 102206 (China)
Description
In this study, the characteristics of nitride-based light-emitting diodes with different last barrier structures are analysed numerically. The energy band diagrams, electrostatic field near the last quantum barrier, carrier concentration in the quantum well, internal quantum efficiency, and light output power are systematically investigated. The simulation results show that the efficiency droop is markedly improved and the output power is greatly enhanced when the conventional GaN last barrier is replaced by an AlGaN barrier with Al composition graded linearly from 0 to 15% in the growth direction. These improvements are attributed to enhanced efficiencies of electron confinement and hole injection caused by the lower polarization effect at the last-barrier/electron blocking layer interface when the graded Al composition last barrier is used. (interdisciplinary physics and related areas of science and technology)
Availability note (English)
Available from http://dx.doi.org/10.1088/1674-1056/21/12/128504Additional details
Identifiers
Publishing Information
- Journal Title
- Chinese Physics. B
- Journal Volume
- 21
- Journal Issue
- 12
- Journal Page Range
- [6 p.]
- ISSN
- 1674-1056
INIS
- Country of Publication
- China
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45026481
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ALUMINIUM COMPOUNDS; COMPUTERIZED SIMULATION; CONCENTRATION RATIO; DEPLETION LAYER; DESIGN; DIFFUSION BARRIERS; ELECTRONIC STRUCTURE; ELECTRONS; GALLIUM NITRIDES; HOLES; INTERFACES; LIGHT EMITTING DIODES; POLARIZATION; QUANTUM EFFICIENCY; QUANTUM WELLS; VISIBLE RADIATION
- Descriptors DEC
- DIMENSIONLESS NUMBERS; EFFICIENCY; ELECTROMAGNETIC RADIATION; ELEMENTARY PARTICLES; FERMIONS; GALLIUM COMPOUNDS; LAYERS; LEPTONS; NANOSTRUCTURES; NITRIDES; NITROGEN COMPOUNDS; PNICTIDES; RADIATIONS; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; SIMULATION