Published May 1996 | Version v1
Report Open

Long term instability in the defect assembly in irradiated high resistivity silicon detectors

  • 1. Ioffe-Physico-Technical Inst., St. Petersburg (Russian Federation)
  • 2. Brookhaven National Lab., Upton, NY (United States)
  • 3. Forschungszentrum Rossendorf e.V. (FZR), Dresden (Germany). Inst. for Ion Beams and Material Research

Description

Different kinetic behavior has been revealed for the two types of irradiated high resistivity silicon detectors in the reactions of the interstitial carbon (Ci) annealing and the formation of the Ci-Oi complex. In the detectors with an increased oxygen contents prolonged growth of the Ci-Oi complex concentration obeyed the second order reaction due to an additional source of Ci atoms which were not detected by DLTS measurements. Transformation of carbon related defects has been analyzed concerning the long term instability of irradiated silicon detectors. 5 refs., 2 figs

Availability note (English)

MF available from INIS under the Report Number; Also available from OSTI as DE96011496; NTIS; US Govt. Printing Office Dep.

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Additional details

Publishing Information

Imprint Pagination
3 p.
Report number
BNL--63117

Conference

Title
Nuclear science symposium and medical imaging conference.
Dates
2-9 Nov 1996.
Place
Anaheim, CA (United States).

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
28014458
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference, Numerical Data
Descriptors DEI
ANNEALING; CARBON COMPLEXES; CHEMICAL REACTION KINETICS; EXPERIMENTAL DATA; INTERSTITIALS; IRRADIATION; OXYGEN COMPLEXES; RADIATION DETECTORS
Descriptors DEC
COMPLEXES; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; DATA; HEAT TREATMENTS; INFORMATION; KINETICS; MEASURING INSTRUMENTS; NUMERICAL DATA; POINT DEFECTS; REACTION KINETICS

Optional Information

Contract/Grant/Project number
Contract AC02-76CH00016
Funding organization
USDOE, Washington, DC (United States).
Secondary number(s)
CONF-961123--3.