Published March 11, 2014
| Version v1
Journal article
Modelling study of magnetic and concentration phase transition in ultrathin antiferromagnetic films
Creators
- 1. Departament of Theoretical and Experimental Physics, The School of Natural Sciences, Far Eastem Federal University, 8, Sukhanova St., 690950, Vladivostok (Russian Federation)
Description
Using the method of the ''average spin'' a modelling study of magnetic and concentration phase transition in ultrathin antiferromagnetic of different crystalline structure has been carried out. It has been shown, that relative change of Neel temperature is subject to the power law with negative index which doesn't depend on the film's crystal kind. The calculation of the dependence of phase transition critical concentration in diluted magnetic material on the film thickness has been made out. The legitimacy of the use of the method developed for modelling of magnetic and concentration phase transition in different nanostructures is certified by accordance between the results of calculations and the experimental data
Availability note (English)
Available from http://dx.doi.org/10.1088/1742-6596/490/1/012021Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Conference Series (Online)
- Journal Volume
- 490
- Journal Issue
- 1
- Journal Page Range
- [4 p.]
- ISSN
- 1742-6596
Conference
- Title
- 2. international conference on mathematical modeling in physical sciences 2013
- Acronym
- IC-MSQUARE 2013
- Dates
- 1-5 Sep 2013
- Place
- Prague (Czech Republic)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46073703
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ANTIFERROMAGNETISM; COMPUTERIZED SIMULATION; CONCENTRATION RATIO; CRYSTAL STRUCTURE; CRYSTALS; MAGNETIC MATERIALS; NANOSTRUCTURES; NEEL TEMPERATURE; PHASE TRANSFORMATIONS; SPIN; THICKNESS; THIN FILMS
- Descriptors DEC
- ANGULAR MOMENTUM; DIMENSIONLESS NUMBERS; DIMENSIONS; FILMS; MAGNETISM; MATERIALS; PARTICLE PROPERTIES; PHYSICAL PROPERTIES; SIMULATION; THERMODYNAMIC PROPERTIES; TRANSITION TEMPERATURE