Published May 1983
| Version v1
Journal article
Tsub(c) measurement of sputter-deposited Nb3Ge films by a balance-bridge method
Creators
- 1. Tohoku Univ., Sendai (Japan). Faculty of Engineering
Description
Tsub(c) values of sputter-deposited Nb3Ge films were measured using both the balance-bridge method and the four-probe resistance method. (author)
Additional details
Publishing Information
- Journal Title
- Cryogenics
- Journal Volume
- 23
- Journal Issue
- 5
- Series
- Cryogenics.
- Journal Page Range
- 265-266
- ISSN
- 0011-2275
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- United Kingdom
- INIS RN
- 15001304
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Numerical Data
- Descriptors DEI
- CRYOGENICS; DEPOSITION; EXPERIMENTAL DATA; FILMS; GERMANIUM ALLOYS; INTERMETALLIC COMPOUNDS; NIOBIUM BASE ALLOYS; SPUTTERING; THICKNESS; TRANSITION TEMPERATURE
- Descriptors DEC
- ALLOYS; DATA; DIMENSIONS; INFORMATION; NIOBIUM ALLOYS; NUMERICAL DATA; PHYSICAL PROPERTIES; THERMODYNAMIC PROPERTIES