Surface modification of materials by dielectric barrier discharge deposition of fluorocarbon films
- 1. School of Science, Dalian Nationalities University, Dalian 116600 (China)
- 2. School of Mechanical Engineering, Dalian Jiaotong University, Dalian 116021 (China)
Description
Dielectric barrier discharges have been used to deposit fluorocarbon (FC) films on various materials, such as paper, glass, and silicon substrates. The primary monomers used for plasma polymerization were difluoromethane (CH2F2), octafluoropropane (C3F8), and octafluorocyclobutane (C4F8). FC films were characterized using Fourier transform infrared spectroscopy, atomic force microscopy, static contact angle measurements, and scanning electron microscopy. Surface and structural properties of deposited films are strongly dependent on the plasma compositions and plasma parameters. FC films deposited on paper are to enhance its barrier properties and to achieve hydrophobic surfaces. Contact angle studies reveal that a minimum FC film thickness of about 200 nm on paper is required to completely cover surface and near-surface fibers, thereby providing the paper with long term hydrophobic character. In the C3F8 and C4F8 systems, the contact angles of the deposited films do not change appreciably with plasma parameters and are strongly dependent on the substrate roughness. Hydrogenated FC films deposited with CH2F2 plasmas show the relatively low contact angles due to the existence of CHX (x = 1-3) groups.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.tsf.2008.11.136Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2008.11.136;
- PII
- S0040-6090(08)01519-8;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 517
- Journal Issue
- 13
- Journal Page Range
- p. 3656-3660
- ISSN
- 0040-6090
- CODEN
- THSFAP
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 42025478
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ATOMIC FORCE MICROSCOPY; DIELECTRIC MATERIALS; FIBERS; FLUORINATED ALIPHATIC HYDROCARBONS; MODIFICATIONS; PLASMA; POLYMERIZATION; SCANNING ELECTRON MICROSCOPY; SILICON; SURFACE COATING; SURFACES; THIN FILMS
- Descriptors DEC
- CHEMICAL REACTIONS; DEPOSITION; ELECTRON MICROSCOPY; ELEMENTS; FILMS; HALOGENATED ALIPHATIC HYDROCARBONS; MATERIALS; MICROSCOPY; ORGANIC COMPOUNDS; ORGANIC FLUORINE COMPOUNDS; ORGANIC HALOGEN COMPOUNDS; SEMIMETALS
Optional Information
- Copyright
- Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.