Dielectric relaxation of samarium aluminate
Creators
- 1. Bose Institute, Department of Physics, Kolkata (India)
Description
A ceramic SmAlO3 (SAO) sample is synthesized by the solid-state reaction technique. The Rietveld refinement of the X-ray diffraction pattern has been done to find the crystal symmetry of the sample at room temperature. An impedance spectroscopy study of the sample has been performed in the frequency range from 50 Hz to 1 MHz and in the temperature range from 313 K to 573 K. Dielectric relaxation peaks are observed in the imaginary parts of the spectra. The Cole-Cole model is used to analyze the dielectric relaxation mechanism in SAO. The temperature-dependent relaxation times are found to obey the Arrhenius law having an activation energy of 0.29 eV, which indicates that polaron hopping is responsible for conduction or dielectric relaxation in this material. The complex impedance plane plot of the sample indicates the presence of both grain and grain-boundary effects and is analyzed by an electrical equivalent circuit consisting of a resistance and a constant-phase element. The frequency-dependent conductivity spectra follow a double-power law due to the presence of two plateaus. (orig.)
Availability note (English)
Available from: http://dx.doi.org/10.1007/s00339-013-7766-4Additional details
Identifiers
Publishing Information
- Journal Title
- Applied Physics. A, Materials Science and Processing
- Journal Volume
- 114
- Journal Issue
- 4
- Journal Page Range
- p. 1097-1104
- ISSN
- 0947-8396
- CODEN
- APAMFC
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 45049703
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Numerical Data
- Descriptors DEI
- ACTIVATION ENERGY; ALUMINATES; CERAMICS; DIELECTRIC PROPERTIES; ELECTRIC CONDUCTIVITY; ELECTRIC IMPEDANCE; EXPERIMENTAL DATA; FREQUENCY DEPENDENCE; GRAIN BOUNDARIES; HZ RANGE; KHZ RANGE 01-100; KHZ RANGE 100-1000; RELAXATION LOSSES; RELAXATION TIME; SAMARIUM COMPOUNDS; TEMPERATURE DEPENDENCE; TEMPERATURE RANGE 0273-0400 K; TEMPERATURE RANGE 0400-1000 K; X-RAY DIFFRACTION
- Descriptors DEC
- ALUMINIUM COMPOUNDS; COHERENT SCATTERING; DATA; DIFFRACTION; ELECTRICAL PROPERTIES; ENERGY; ENERGY LOSSES; FREQUENCY RANGE; IMPEDANCE; INFORMATION; KHZ RANGE; LOSSES; MICROSTRUCTURE; NUMERICAL DATA; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; RARE EARTH COMPOUNDS; SCATTERING; TEMPERATURE RANGE