Published November 2006
| Version v1
Journal article
Detection of nanocrystallinity by X-ray absorption spectroscopy in thin film transition metal/rare-earth atom, elemental and complex oxides
- 1. Department of Materials Science, Pennsylvania State University, State College, PA (United States)
- 2. Department of Materials Science, University of California at Santa Barbara, Santa Barbara, CA (United States)
- 3. Department of Physics, Raleigh, North Carolina State University, NC (United States)
- 4. Stranford Synchrotron Radiation Labs, Stanford University, Menlo Park, CA (United States)
Description
Nanocrystallinity has been detected in the X-ray absorption spectra of transition metal and rare-earth oxides by (i) removal of d-state degeneracies in the (a) Ti and Sc L3 spectra of TiO2 and LaScO3, respectively, and (b) O K1 spectra of Zr(Hf)O2, Y2O3, LaScO3 and LaAlO3, and by the (ii) detection of the O-atom vacancy in the O K1 edge ZrO2-Y2O3 alloys. Spectroscopic detection is more sensitive than X-ray diffraction with a limit of ∼2 nm as compared to >5 mm. Other example includes detection of ZrO2 nanocrystallinity in phase-separated Zr(Hf) silicate alloys
Additional details
Identifiers
- DOI
- 10.1016/j.radphyschem.2006.05.005;
- PII
- S0969-806X(06)00226-X;
Publishing Information
- Journal Title
- Radiation Physics and Chemistry (1993)
- Journal Volume
- 75
- Journal Issue
- 11
- Journal Page Range
- p. 1608-1612
- ISSN
- 0969-806X
- CODEN
- RPCHDM
Conference
- Title
- 20. international conference on X-ray and inner-shell processes
- Dates
- 4-8 Jul 2005
- Place
- Melbourne (Australia)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38040068
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ABSORPTION SPECTROSCOPY; ALUMINATES; ATOMS; D STATES; HAFNIUM OXIDES; JAHN-TELLER EFFECT; LANTHANUM COMPOUNDS; SILICATES; SILICON ALLOYS; THIN FILMS; TITANIUM OXIDES; TRANSITION ELEMENTS; X-RAY DIFFRACTION; X-RAY SPECTRA; X-RAY SPECTROSCOPY; YTTRIUM OXIDES; ZIRCONIUM OXIDES
- Descriptors DEC
- ALLOYS; ALUMINIUM COMPOUNDS; CHALCOGENIDES; COHERENT SCATTERING; DIFFRACTION; ELEMENTS; ENERGY LEVELS; FILMS; HAFNIUM COMPOUNDS; METALS; OXIDES; OXYGEN COMPOUNDS; RARE EARTH COMPOUNDS; REFRACTORY METAL COMPOUNDS; SCATTERING; SILICON COMPOUNDS; SPECTRA; SPECTROSCOPY; TITANIUM COMPOUNDS; TRANSITION ELEMENT COMPOUNDS; YTTRIUM COMPOUNDS; ZIRCONIUM COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.