Order-disorder transitions in the Fe2VAl Heusler alloy
- 1. Université Paris Est, ICMPE (UMR 7182), CNRS, UPEC, 94320, Thiais (France)
- 2. Transilvania University of Brasov, B-dul Eroilor 29, Brasov, 500036 (Romania)
Description
A Rietveld analysis of neutron powder diffraction patterns obtained in situ during temperature scans shows that Fe2VAl crystallizes at room temperature in the fully ordered L21 structure and transforms at 1080 °C and at 1190 °C into partially disordered B2 and fully disordered A2 variants respectively. The low temperature stability of the L21 structure as well as the two high temperature L21 → B2 → A2 transitions are theoretically predicted by a combination of ab-initio (electronic structure and phonons) and thermodynamic calculations performed on special quasi-random structures. Pronounced cold work effects and the pre-transitional antisite defects which are observed respectively at 25 °C under mechanical stress and at high temperature (above 800 °C), appear to be generic effects in the family of Heusler alloys.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.actamat.2016.08.080Additional details
Identifiers
- DOI
- 10.1016/j.actamat.2016.08.080;
- PII
- S1359-6454(16)30673-5;
Publishing Information
- Journal Title
- Acta Materialia
- Journal Volume
- 121
- Journal Page Range
- p. 126-136
- ISSN
- 1359-6454
- CODEN
- ACMAFD
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 48092086
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ELECTRONIC STRUCTURE; HEUSLER ALLOYS; NEUTRON DIFFRACTION; ORDER-DISORDER TRANSFORMATIONS; PHONONS
- Descriptors DEC
- ALLOYS; ALUMINIUM ALLOYS; COHERENT SCATTERING; COPPER ALLOYS; COPPER BASE ALLOYS; CORROSION RESISTANT ALLOYS; DIFFRACTION; MANGANESE ALLOYS; PHASE TRANSFORMATIONS; QUASI PARTICLES; SCATTERING; TRANSITION ELEMENT ALLOYS
Optional Information
- Copyright
- Copyright (c) 2016 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.