Published 1990
| Version v1
Book
The effects of metal doping
Creators
- 1. Materials Science Dept., Brookhaven National Lab., Upton, NY (United States)
- 2. Exxon PRT, Brookhaven National Lab., Upton, NY (United States)
- 3. Condensed Matter Physics Branch, Naval Research Lab., Washington, DC (United States)
Description
In this paper the authors describe X-ray absorption measurements designed to determine the influence of substituents on the location of dopants, the valence of dopants, structural changes, and modifications of electronic densities of states. Several possible mechanisms are offered which may elucidate Tc suppression due to metal dopings
Additional details
Additional titles
- Subtitle (English)
- YBa_2(Cu_1_-_xM_x)_3O_7_-_#delta# (M = Fe, Co, Ni, and Zn)
Publishing Information
- Publisher
- Materials Research Society.
- Imprint Place
- Pittsburgh, PA (United States)
- ISBN
- 1-55899-057-7
- Imprint Title
- High-temperature superconductors: Fundamental properties and novel materials processing
- Imprint Pagination
- 1322 p.
- Journal Page Range
- p. 225-228.
Conference
- Title
- Materials Research Society fall meeting.
- Dates
- 27 Nov - 2 Dec 1989.
- Place
- Boston, MA (United States).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 23024543
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CHEMICAL REACTION KINETICS; COBALT ADDITIONS; CRYSTAL DOPING; ELECTRONIC STRUCTURE; HIGH-TC SUPERCONDUCTORS; IRON ADDITIONS; MODIFICATIONS; NICKEL ADDITIONS; PHASE DIAGRAMS; SUPERCONDUCTIVITY; TRANSITION TEMPERATURE; X-RAY SPECTRA; YTTRIUM COMPOUNDS; ZINC ADDITIONS
- Descriptors DEC
- DIAGRAMS; ELECTRIC CONDUCTIVITY; ELECTRICAL PROPERTIES; INFORMATION; KINETICS; PHYSICAL PROPERTIES; REACTION KINETICS; SPECTRA; SUPERCONDUCTORS; THERMODYNAMIC PROPERTIES; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Secondary number(s)
- CONF-891119--.