Enhanced adhesion buffer layer for deep x-ray lithography using hard x rays
Creators
- 1. Advanced Photon Source APS-XFD, Argonne National Laboratory, Argonne, Illinois 60439 (United States)
Description
The first step in the fabrication of microstructures using deep x-ray lithography (DXRL) is the irradiation of an x-ray sensitive resist like polymethylmethacrylate (PMMA) by hard x rays. At the Advanced Photon Source, a dedicated beamline allows the proper exposure of very thick (several mm) resists. To fabricate electroformed metal microstructures with heights of several mm, a PMMA sheet is glued onto a metallic plating base. An important requirement is that the PMMA layer must adhere well to the plating base. The adhesion is greatly reduced by the penetration of even a small fraction of hard x rays through the mask absorber into the substrate. In this work we will show a novel technique to improve the adhesion of PMMA onto high-Z substrates for DXRL. Results of the improved adhesion are shown for different exposure/substrate conditions. copyright 1998 American Vacuum Society
Additional details
Additional titles
- Augmented title (English)
- PMMA
Publishing Information
- Journal Title
- Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena
- Journal Volume
- 16
- Journal Issue
- 6
- Journal Page Range
- p. 3539-3542
- ISSN
- 0734-211X
- CODEN
- JVTBD9
Conference
- Title
- 42. international conference on electron, ion, and photon beam technology and nanofabrication
- Dates
- 26-29 May 1998
- Place
- Chicago, IL (United States)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 30010580
- Subject category
- S36: MATERIALS SCIENCE; S36: MATERIALS SCIENCE; S07: ISOTOPES AND RADIATION SOURCES;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ADHESION; ADVANCED PHOTON SOURCE; HARD X RADIATION; MASKING; MICROELECTRONICS; PHYSICAL RADIATION EFFECTS; PMMA
- Descriptors DEC
- ELECTROMAGNETIC RADIATION; ESTERS; IONIZING RADIATIONS; ORGANIC COMPOUNDS; ORGANIC POLYMERS; POLYACRYLATES; POLYMERS; POLYVINYLS; RADIATION EFFECTS; RADIATION SOURCES; RADIATIONS; STORAGE RINGS; SYNCHROTRON RADIATION SOURCES; X RADIATION
Optional Information
- Secondary number(s)
- CONF-9805132--