Materials for optoelectronic devices, OEICs and photonics
Description
The aim of the contributors in this volume is to give a current overview on the basic properties of nonlinear optical materials for optoelectronics and integrated optics. They provide a cross-linkage between different materials (III-V, II-VI, Si-Ge, etc.), various sample dimensions (from bulk crystals to quantum dots), and a range of techniques from growth (LPE to MOMBE) and for processing from surface passivation to ion beams. Major growth techniques and materials are discussed, including the sophisticated technologies required to exploit the exciting properties of low dimensional semiconductors. These proceedings will prove an invaluable guide to the current state of optoelectronic materials development, as well as indicating the growth techniques that will be in use around the year 2000
Additional details
Publishing Information
- Publisher
- North-Holland.
- Imprint Place
- Amsterdam (Netherlands)
- ISBN
- 0 444 89317 2
- Imprint Pagination
- 586 p.
- Journal Volume
- 19
- Series
- European Materials Research Society Symposia Proceedings.
Conference
- Title
- Symposium A on Semiconductor Materials for Optoelectronic Devices and OEICs and Symposium B on Nonlinear Optical Materials for Optoelectronics and Integrated Optics of the 1990 E-MRS Fall Conference.
- Dates
- 27-30 Nov 1990.
- Place
- Strasbourg (France).
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 24046790
- Subject category
- S36: MATERIALS SCIENCE; S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CRYSTAL GROWTH; CRYSTAL GROWTH METHODS; DIELECTRIC MATERIALS; ELECTRO-OPTICAL EFFECTS; MATERIALS TESTING; OPTICAL PROPERTIES; OPTICAL SYSTEMS; SEMICONDUCTOR MATERIALS
- Descriptors DEC
- MATERIALS; PHYSICAL PROPERTIES; TESTING