Published 1991 | Version v1
Book

Materials for optoelectronic devices, OEICs and photonics

Description

The aim of the contributors in this volume is to give a current overview on the basic properties of nonlinear optical materials for optoelectronics and integrated optics. They provide a cross-linkage between different materials (III-V, II-VI, Si-Ge, etc.), various sample dimensions (from bulk crystals to quantum dots), and a range of techniques from growth (LPE to MOMBE) and for processing from surface passivation to ion beams. Major growth techniques and materials are discussed, including the sophisticated technologies required to exploit the exciting properties of low dimensional semiconductors. These proceedings will prove an invaluable guide to the current state of optoelectronic materials development, as well as indicating the growth techniques that will be in use around the year 2000

Additional details

Publishing Information

Publisher
North-Holland.
Imprint Place
Amsterdam (Netherlands)
ISBN
0 444 89317 2
Imprint Pagination
586 p.
Journal Volume
19
Series
European Materials Research Society Symposia Proceedings.

Conference

Title
Symposium A on Semiconductor Materials for Optoelectronic Devices and OEICs and Symposium B on Nonlinear Optical Materials for Optoelectronics and Integrated Optics of the 1990 E-MRS Fall Conference.
Dates
27-30 Nov 1990.
Place
Strasbourg (France).

INIS

Country of Publication
Netherlands
Country of Input or Organization
Netherlands
INIS RN
24046790
Subject category
S36: MATERIALS SCIENCE; S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
CRYSTAL GROWTH; CRYSTAL GROWTH METHODS; DIELECTRIC MATERIALS; ELECTRO-OPTICAL EFFECTS; MATERIALS TESTING; OPTICAL PROPERTIES; OPTICAL SYSTEMS; SEMICONDUCTOR MATERIALS
Descriptors DEC
MATERIALS; PHYSICAL PROPERTIES; TESTING