Published July 1, 2009 | Version v1
Journal article

Plasma sheath physics and dose uniformity in enhanced glow discharge plasma immersion ion implantation and deposition

  • 1. Department of Physics and Materials Science, City University of Hong Kong, Tat Chee Avenue, Kowloon (Hong Kong)
  • 2. Department 702, School of Mechanical and Automation Engineering, Beijing University of Aeronautics and Astronautics, Beijing 100191 (China)

Description

Based on the multiple-grid particle-in-cell code, an advanced simulation model is established to study the sheath physics and dose uniformity along the sample stage in order to provide the theoretical basis for further improvement of enhanced glow discharge plasma immersion ion implantation and deposition. At t=7.0 μs, the expansion of the sheath in the horizontal direction is hindered by the dielectric cage. The electron focusing effect is demonstrated by this model. Most of the ions at the inside wall of the cage are implanted into the edge of the sample stage and a relatively uniform ion fluence distribution with a large peak is observed at the end. Compared to the results obtained from the previous model, a higher implant fluence and larger area of uniformity are disclosed.

Additional details

Identifiers

Publishing Information

Journal Title
Journal of Applied Physics
Journal Volume
106
Journal Issue
1
Journal Page Range
p. 013313-013313.3
ISSN
0021-8979
CODEN
JAPIAU

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
41094442
Subject category
S70: PLASMA PHYSICS AND FUSION TECHNOLOGY; S36: MATERIALS SCIENCE;
Descriptors DEI
DEPOSITION; DIELECTRIC MATERIALS; EXPANSION; FOCUSING; GLOW DISCHARGES; ION IMPLANTATION; PLASMA SHEATH; PLASMA SIMULATION
Descriptors DEC
ELECTRIC DISCHARGES; MATERIALS; SIMULATION

Optional Information

Notes
(c) 2009 American Institute of Physics