Plasma sheath physics and dose uniformity in enhanced glow discharge plasma immersion ion implantation and deposition
- 1. Department of Physics and Materials Science, City University of Hong Kong, Tat Chee Avenue, Kowloon (Hong Kong)
- 2. Department 702, School of Mechanical and Automation Engineering, Beijing University of Aeronautics and Astronautics, Beijing 100191 (China)
Description
Based on the multiple-grid particle-in-cell code, an advanced simulation model is established to study the sheath physics and dose uniformity along the sample stage in order to provide the theoretical basis for further improvement of enhanced glow discharge plasma immersion ion implantation and deposition. At t=7.0 μs, the expansion of the sheath in the horizontal direction is hindered by the dielectric cage. The electron focusing effect is demonstrated by this model. Most of the ions at the inside wall of the cage are implanted into the edge of the sample stage and a relatively uniform ion fluence distribution with a large peak is observed at the end. Compared to the results obtained from the previous model, a higher implant fluence and larger area of uniformity are disclosed.
Additional details
Identifiers
- DOI
- 10.1063/1.3160309;
Publishing Information
- Journal Title
- Journal of Applied Physics
- Journal Volume
- 106
- Journal Issue
- 1
- Journal Page Range
- p. 013313-013313.3
- ISSN
- 0021-8979
- CODEN
- JAPIAU
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41094442
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY; S36: MATERIALS SCIENCE;
- Descriptors DEI
- DEPOSITION; DIELECTRIC MATERIALS; EXPANSION; FOCUSING; GLOW DISCHARGES; ION IMPLANTATION; PLASMA SHEATH; PLASMA SIMULATION
- Descriptors DEC
- ELECTRIC DISCHARGES; MATERIALS; SIMULATION
Optional Information
- Notes
- (c) 2009 American Institute of Physics