Published 2002
| Version v1
Miscellaneous
Scanning force microscopy and computer simulations - complementary techniques for nanostructured materials and thin films
Creators
- 1. University of Applied Sciences Wildau (Berlin), Department of Engineering Physics, Wildau (Germany)
- 2. School of Mathematics and Physics, Loughborough University, Loughborough (United Kingdom)
Description
no abstract available
Additional details
Additional titles
- Augmented title (English)
- fullerenes
Publishing Information
- Imprint Title
- Abstracts of International Conference on Solid State Crystals - Materials Science and Applications
- Imprint Pagination
- 210 p.
- Journal Page Range
- p. 33
Conference
- Title
- International Conference on Solid State Crystals - Materials Science and Applications
- Dates
- 14-18 Oct 2002
- Place
- Zakopane (Poland)
INIS
- Country of Publication
- Poland
- Country of Input or Organization
- Poland
- INIS RN
- 34075278
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- No Abstract, Conference, Non-conventional Literature
- Descriptors DEI
- ATOMIC FORCE MICROSCOPY; COMPUTERIZED SIMULATION; ELASTICITY; FULLERENES; GLASS; MICA; MICROHARDNESS; MICROSTRUCTURE; MOLECULAR DYNAMICS METHOD; MONTE CARLO METHOD; PLASTICITY; SILICON; SUBSTRATES; SURFACE COATING; THIN FILMS; YOUNG MODULUS
- Descriptors DEC
- CALCULATION METHODS; CARBON; DEPOSITION; ELEMENTS; FILMS; HARDNESS; MECHANICAL PROPERTIES; MICROSCOPY; MINERALS; NONMETALS; SEMIMETALS; SILICATE MINERALS; SIMULATION
Optional Information
- Notes
- 6 refs