In situ observation of the melting and sintering of submicron-sized bismuth particles
Creators
- 1. Institute of Inorganic Chemistry, University of Karlsruhe (Thailand), Engesserstrasse 15, D-76131 Karlsruhe (Germany)
Description
The sintering and melting of submicron-sized bismuth particles were studied in situ via scanning electron microscopy. The relevant bismuth particles were prepared via a polyol-mediated synthesis, which results in spherical and non-agglomerated particles, about 250 nm in size. The samples as well as suitable references were deposited on a heater stage assembly inside a scanning electron microscope. Both were investigated up to temperatures of 480 deg. C. Surprisingly, sample areas continuously scanned by the electron beam showed neither sintering nor melting of submicron-sized bismuth, whereas melting was observed at temperatures between 250 and 270 deg. C in non-scanned areas. This behavior was ascribed to an electron-beam-induced decomposition of organic stabilizers that adhered on the bismuth particles to form a thin layer of amorphous carbon. For experimental verification of this hypothesis, controlled carbon coating of submicron-sized bismuth particles was conducted.
Availability note (English)
Available from http://dx.doi.org/10.1088/0957-4484/20/12/125704Additional details
Identifiers
- DOI
- 10.1088/0957-4484/20/12/125704;
- PII
- S0957-4484(09)99788-4;
Publishing Information
- Journal Title
- Nanotechnology (Print)
- Journal Volume
- 20
- Journal Issue
- 12
- Journal Page Range
- [8 p.]
- ISSN
- 0957-4484
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41012596
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Descriptors DEI
- BISMUTH; ELECTRON BEAMS; MELTING; SCANNING ELECTRON MICROSCOPY; SINTERING; SPHERICAL CONFIGURATION; SYNTHESIS; TEMPERATURE RANGE 0400-1000 K; THIN FILMS
- Descriptors DEC
- BEAMS; CONFIGURATION; ELECTRON MICROSCOPY; ELEMENTS; FABRICATION; FILMS; LEPTON BEAMS; METALS; MICROSCOPY; PARTICLE BEAMS; PHASE TRANSFORMATIONS; TEMPERATURE RANGE