fastSIM: a practical implementation of fast structured illumination microscopy
Creators
- 1. Leibniz Institute of Photonic Technology, Jena (Germany)
Description
A significant improvement in acquisition speed of structured illumination microscopy (SIM) opens a new field of applications to this already well-established super-resolution method towards 3D scanning real-time imaging of living cells. We demonstrate a method of increased acquisition speed on a two-beam SIM fluorescence microscope with a lateral resolution of ∼100 nm at a maximum raw data acquisition rate of 162 frames per second (fps) with a region of interest of 16.5 × 16.5 µm2, free of mechanically moving components. We use a programmable spatial light modulator (ferroelectric LCOS) which promises precise and rapid control of the excitation pattern in the sample plane. A passive Fourier filter and a segmented azimuthally patterned polarizer are used to perform structured illumination with maximum contrast. Furthermore, the free running mode in a modern sCMOS camera helps to achieve faster data acquisition. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/2050-6120/3/1/014001Additional details
Identifiers
Publishing Information
- Journal Title
- Methods and Applications in Fluorescence
- Journal Volume
- 3
- Journal Issue
- 1
- Journal Page Range
- [9 p.]
- ISSN
- 2050-6120
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 47061552
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S74: ATOMIC AND MOLECULAR PHYSICS; S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Descriptors DEI
- BEAMS; CAMERAS; DATA ACQUISITION; EXCITATION; FERROELECTRIC MATERIALS; FILTERS; FLUORESCENCE; ILLUMINANCE; IMAGE PROCESSING; IMAGE SCANNERS; IMAGES; IMPLEMENTATION; MICROSCOPES; MICROSCOPY; REAL TIME SYSTEMS; RESOLUTION; THREE-DIMENSIONAL CALCULATIONS; VELOCITY
- Descriptors DEC
- DATA PROCESSING; DIELECTRIC MATERIALS; EMISSION; ENERGY-LEVEL TRANSITIONS; LUMINESCENCE; MATERIALS; PHOTON EMISSION; PROCESSING