Published October 2009 | Version v1
Journal article

Perforated diode neutron detector modules fabricated from high-purity silicon

  • 1. S.M.A.R.T. Laboratory, Department of Mechanical and Nuclear Engineering, 3002 Rathbone Hall, Kansas State University, Manhattan, KS 66506-2503 (United States)
  • 2. Department of Mechanical and Nuclear Engineering, 3002 Rathbone Hall, Kansas State University, Manhattan, KS 66506-2503 (United States)

Description

Compact neutron detectors are being designed and tested for use as low-power real-time personnel dosimeters. The neutron detectors are pin diodes that are mass produced from high-purity Si wafers. Each detector has thousands of circular perforations etched vertically into the device. The perforations are backfilled with 6LiF to make the pin diodes sensitive to thermal neutrons. The prototype devices deliver 4.7% thermal neutron detection efficiency while operating on only 15 V, showing a 9% increase in efficiency over identical planar devices.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.radphyschem.2009.04.027

Additional details

Identifiers

DOI
10.1016/j.radphyschem.2009.04.027;
PII
S0969-806X(09)00166-2;

Publishing Information

Journal Title
Radiation Physics and Chemistry
Journal Volume
78
Journal Issue
10
Journal Page Range
p. 874-881
ISSN
0969-806X
CODEN
RPCHDM

Conference

Title
Workshop on use of Monte Carlo techniques for design and analysis of radiation detectors
Dates
15-17 Sep 2006
Place
Coimbra (Portugal)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
41020759
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
DOSEMETERS; NEUTRON DETECTORS; SEMICONDUCTOR MATERIALS; SILICON; THERMAL NEUTRONS
Descriptors DEC
BARYONS; ELEMENTARY PARTICLES; ELEMENTS; FERMIONS; HADRONS; MATERIALS; MEASURING INSTRUMENTS; NEUTRONS; NUCLEONS; RADIATION DETECTORS; SEMIMETALS

Optional Information

Copyright
Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.