Detection and measurement in emission and transmission tomography and applications
Description
The theory and application of computerised tomography in non-destructive testing, in emission and transmission mode, utilising X- and gamma-rays is the subject of this study. Detection characteristics pertinent to imaging applications were measured for a number of detectors (e.g. NaI, BGO, CsF, HPGe, CdTe). The relative merits of each detector type are compared and their relative suitability predicted. A prototype scanning rig was designed and used to carry out tomography experiments with phantoms in emission and transmission mode, and contrast and spatial resolution under various conditions were determined. The usefulness of line scans and contrast measurements in quantitative image analysis is shown. The effects of scattered photons on image quality were studied by means of the selection of different discriminator energy windows. In each scan the counts within the full width at half and tenth maximum of the photopeak were used as the data for the reconstruction. A method for subtracting the scattered photon contribution from the peak window was also developed and its successful application demonstrated. The results obtained from the scanning experiments illustrate the image degradation caused by scattered photons. The effects of scattered photons increase with energy and are more acute in emission mode. (author)
Availability note (English)
Available from British Library, Boston Spa, Wetherby, West Yorks. No. D44812/83.Additional details
Publishing Information
- Imprint Pagination
- 236 p.
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- United Kingdom
- INIS RN
- 14807000
- Subject category
- S42: ENGINEERING; S62: RADIOLOGY AND NUCLEAR MEDICINE; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Thesis, Non-conventional Literature
- Descriptors DEI
- CDTE SEMICONDUCTOR DETECTORS; CESIUM FLUORIDES; COMPARATIVE EVALUATIONS; DATA PROCESSING; EMISSION COMPUTED TOMOGRAPHY; GAMMA RADIATION; GE SEMICONDUCTOR DETECTORS; IMAGE PROCESSING; IMAGE SCANNERS; NAI DETECTORS; NONDESTRUCTIVE TESTING; PHANTOMS
- Descriptors DEC
- ALKALI METAL COMPOUNDS; CESIUM COMPOUNDS; COMPUTERIZED TOMOGRAPHY; DIAGNOSTIC TECHNIQUES; ELECTROMAGNETIC RADIATION; FLUORIDES; FLUORINE COMPOUNDS; HALIDES; HALOGEN COMPOUNDS; IONIZING RADIATIONS; MATERIALS TESTING; MEASURING INSTRUMENTS; MOCKUP; RADIATION DETECTORS; RADIATIONS; SCINTILLATION COUNTERS; SEMICONDUCTOR DETECTORS; SOLID SCINTILLATION DETECTORS; STRUCTURAL MODELS; TESTING; TOMOGRAPHY