Published October 2010
| Version v1
Journal article
Double-pass point diffraction interferometer
Creators
- 1. Center for Space Optics, Korea Research Institute of Standards and Science, 1 Doryong-dong, Yuseong-gu, Daejeon 305-340 (Korea, Republic of)
Description
We propose a new point diffraction interferometer for qualitative optical analysis. Point diffraction is made two times to generate interfering waves with a single pinholed polarizer. Diffraction from a pinholed polarizer makes reference and measurement waves with a double-pass configuration. A quarter-wave plate rotates their polarization angles after reciprocation. The interferogram between the diffracted–undiffracted measurement wave and the undiffracted–diffracted reference wave is vibration-insensitive due to a common-path configuration. We examined its capability by changing the pinhole size and divergence angle of the diffracted wave for test optics with various numerical apertures
Availability note (English)
Available from http://dx.doi.org/10.1088/0957-0233/21/10/105307Additional details
Identifiers
- DOI
- 10.1088/0957-0233/21/10/105307;
- PII
- S0957-0233(10)59975-2;
Publishing Information
- Journal Title
- Measurement Science and Technology
- Journal Volume
- 21
- Journal Issue
- 10
- Journal Page Range
- [5 p.]
- ISSN
- 0957-0233
- CODEN
- MSTCEP
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45005252
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- APERTURES; DIFFRACTION; INTERFEROMETERS; OPTICS; POLARIZATION
- Descriptors DEC
- COHERENT SCATTERING; MEASURING INSTRUMENTS; OPENINGS; SCATTERING