Published October 2010 | Version v1
Journal article

Double-pass point diffraction interferometer

  • 1. Center for Space Optics, Korea Research Institute of Standards and Science, 1 Doryong-dong, Yuseong-gu, Daejeon 305-340 (Korea, Republic of)

Description

We propose a new point diffraction interferometer for qualitative optical analysis. Point diffraction is made two times to generate interfering waves with a single pinholed polarizer. Diffraction from a pinholed polarizer makes reference and measurement waves with a double-pass configuration. A quarter-wave plate rotates their polarization angles after reciprocation. The interferogram between the diffracted–undiffracted measurement wave and the undiffracted–diffracted reference wave is vibration-insensitive due to a common-path configuration. We examined its capability by changing the pinhole size and divergence angle of the diffracted wave for test optics with various numerical apertures

Availability note (English)

Available from http://dx.doi.org/10.1088/0957-0233/21/10/105307

Additional details

Identifiers

DOI
10.1088/0957-0233/21/10/105307;
PII
S0957-0233(10)59975-2;

Publishing Information

Journal Title
Measurement Science and Technology
Journal Volume
21
Journal Issue
10
Journal Page Range
[5 p.]
ISSN
0957-0233
CODEN
MSTCEP

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
45005252
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
APERTURES; DIFFRACTION; INTERFEROMETERS; OPTICS; POLARIZATION
Descriptors DEC
COHERENT SCATTERING; MEASURING INSTRUMENTS; OPENINGS; SCATTERING