Published January 15, 1975 | Version v1
Journal article Metadata-only

A new approach to semiconductor detector efficiency calibration

Creators

  • 1. Laboratory of Physics, University of Lisbon, Lisbon, Portugal

Description

no abstract available

Additional details

Identifiers

DOI
10.1016/0029-554x(75)90011-7;

Publishing Information

Journal Title
Nuclear Instruments and Methods
Journal Volume
123
Journal Issue
2
Series
Nucl. Instrum. Methods.
Journal Page Range
295-300
ISSN
0029-554X

INIS

Country of Publication
Netherlands
Country of Input or Organization
Netherlands
INIS RN
6185663
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
CALIBRATION; EFFICIENCY; KEV RANGE 10-100; KEV RANGE 100-1000; LI-DRIFTED GE DETECTORS; MEV RANGE 01-10
Descriptors DEC
ENERGY RANGE; GE SEMICONDUCTOR DETECTORS; KEV RANGE; LI-DRIFTED DETECTORS; MEASURING INSTRUMENTS; MEV RANGE; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS

Optional Information

Notes
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