X-ray photoelectron spectroscopy and low temperature Mössbauer study of Ce3+ substituted MnFe2O4
Creators
- 1. Presidency University, Department of Physics, School of Engineering (India)
- 2. Research Institute of Physics, Southern Federal University (Russian Federation)
- 3. Southern Federal University, International Research Center 'Smart Materials' (Russian Federation)
- 4. Bangalore University, Department of Physics (India)
Description
Spinel Mn2+ Fe2−x3+Cex3+O4 (where x = 0.01–0.05) polycrystalline nanoparticles were fabricated by solution combustion method using glucose and urea as fuels. X-ray diffractogram (XRD) proved the witness of the cubic crystal consort of products which have the crystallite sizes in between 12 and 8 nm. The size of the sample was accomplished via transmission electron microscopy. The elemental composition of iron and manganese ions valences of MnCexFe2−xO4 samples were analyzed by X-ray photoelectron spectroscopy. XPS data reveals iron in all samples was trivalent; manganese was divalent, although tetravalent manganese ions were present on the surface of particles. Magnetic characterization of samples was done via Mössbauer spectroscopy at room temperature and at low temperatures (15 K). The Mössbauer analysis determines the consequence of Ce3+ substitution on isomer shift and quadrupole splitting of all samples. The low temperature Mössbauer spectroscopy results indicate that the presence of Ce3+ ions in the octahedron sites causes the decrease in the concentration of Fe3+ ions.
Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Materials Science. Materials in Electronics
- Journal Volume
- 30
- Journal Issue
- 11
- Journal Page Range
- p. 10162-10171
- ISSN
- 0957-4522
- CODEN
- JSMEEV
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 52019047
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CERIUM IONS; IRON IONS; ISOMER SHIFT; MANGANESE IONS; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION; X-RAY PHOTOELECTRON SPECTROSCOPY; X-RAY SPECTROSCOPY
- Descriptors DEC
- CHARGED PARTICLES; COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; ELECTRON SPECTROSCOPY; IONS; MICROSCOPY; PHOTOELECTRON SPECTROSCOPY; SCATTERING; SPECTROSCOPY
Optional Information
- Copyright
- Copyright (c) 2019 Springer Science+Business Media, LLC, part of Springer Nature