Published March 28, 2010
| Version v1
Journal article
EUV emission spectra in collisions of multiply charged Sn ions with He and Xe
- 1. Department of Physics, Tokyo Metropolitan University, Hachioji, Tokyo 192-0397 (Japan)
- 2. Institute of Laser Engineering, Osaka University, Suita, Osaka 565-0871 (Japan)
- 3. Quantum Beam Science Directorate, Japan Atomic Energy Agency, Kizugawa, Kyoto 619-0215 (Japan)
Description
Extreme ultraviolet emission spectra of multiply charged Sn ions were measured in the wavelength range 5-38 nm, following electron capture into the excited states of slow Snq+ (q = 5-21) ions passing through He and Xe gas targets. Identification of the transitions was carried out by comparison with calculations using the Hebrew University Livermore Laboratory Atomic physics Code. The target and the charge-state dependences of 4d-nl (nl = 4f, 5p and 5f) and 4p-4d transitions were observed.
Availability note (English)
Available from http://dx.doi.org/10.1088/0953-4075/43/6/065204Additional details
Identifiers
- DOI
- 10.1088/0953-4075/43/6/065204;
- PII
- S0953-4075(10)38524-7;
Publishing Information
- Journal Title
- Journal of Physics. B, Atomic, Molecular and Optical Physics
- Journal Volume
- 43
- Journal Issue
- 6
- Journal Page Range
- [7 p.]
- ISSN
- 0953-4075
- CODEN
- JPAPEH
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41114137
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS;
- Descriptors DEI
- CHARGE STATES; COLLISIONS; COMPARATIVE EVALUATIONS; ELECTRON CAPTURE; EMISSION SPECTRA; EXCITED STATES; EXTREME ULTRAVIOLET RADIATION; EXTREME ULTRAVIOLET SPECTRA; HELIUM; ION-ATOM COLLISIONS; MULTICHARGED IONS; TIN IONS; WAVELENGTHS; XENON
- Descriptors DEC
- ATOM COLLISIONS; CAPTURE; CHARGED PARTICLES; COLLISIONS; ELECTROMAGNETIC RADIATION; ELEMENTS; ENERGY LEVELS; EVALUATION; FLUIDS; GASES; ION COLLISIONS; IONS; NONMETALS; RADIATIONS; RARE GASES; SPECTRA; ULTRAVIOLET RADIATION; ULTRAVIOLET SPECTRA