Published February 18, 2008 | Version v1
Journal article

Study of residual background carriers in midinfrared InAs/GaSb superlattices for uncooled detector operation

  • 1. Air Force Research Laboratory, Materials and Manufacturing Directorate, Wright-Patterson Air Force Base, Ohio 45433 (United States)

Description

The midinfrared 7 ML InAs/8 ML GaSb superlattices (SLs) were grown by molecular beam epitaxy at growth temperatures between 370 and 430 deg. C in order to study the intrinsic characteristic of background carriers. Grown SLs were all residual p type with carrier densities in the low 1011 cm-2, and a minimum density of 1.8x1011 cm-2 was obtained from the SL grown at 400 deg. C. With increasing growth temperature, the in-plane carrier mobility decreased from 8740 to 1400 cm2/V s due to increased interfacial roughness, while the photoluminescence intensity increased sixfold due to a decrease in the nonradiative defect densities

Additional details

Identifiers

Publishing Information

Journal Title
Applied Physics Letters
Journal Volume
92
Journal Issue
7
Journal Page Range
p. 071102-071102.3
ISSN
0003-6951
CODEN
APPLAB

Optional Information

Notes
(c) 2008 American Institute of Physics